Conference paper information

A system for monitoring the spatial and intensity distribution on CCD patterns applied to in situ characterization

M. Carpentieri, J. Silveira, R. Giannetti

17th IMEKO World Congress on Metrology in the 3rd Millennium, Dubrovnik (Croatia). 22-27 June 2003

Summary:

No disponible/Not available

Keywords: No disponible/Not available

Publication date: 22-Jun-2003.

Citation:
M. Carpentieri, J. Silveira, R. Giannetti, "A system for monitoring the spatial and intensity distribution on CCD patterns applied to in situ characterization", presented at 17th IMEKO World Congress on Metrology in the 3rd Millennium, Dubrovnik, Croatia, 22-27 June 2003

Research groups:

Instituto de Investigación Tecnológica (IIT)

IIT-03-126C

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